The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2022

Filed:

May. 17, 2019
Applicant:

Hong Kong Applied Science and Technology Research Institute Company Limited, Shatin, HK;

Inventors:

Vladislav Nikitin, Ma On Shan, HK;

Changli Wu, Sheung Shui, HK;

Qi Lang, Kowloon, HK;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0064 (2013.01); G02B 21/0032 (2013.01);
Abstract

The invention provides a chromatic confocal system for inspecting an object. The system comprises a first light modulator for providing a spatially modulated light beam arranged to project on one or more parts of the object to form a reflected light beam carrying image information of the one or more projected parts of the object; a second light modulator for spatially filtering the reflected light beam to form a light beam carrying filtered image information of the one or more projected parts of the object; wherein operation of the first light modulator and the second light modulator is synchronized such that the spatial filtering of the second light modulator varies in concert with variations in the spatial modulation of the first light modulator.


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