The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2022

Filed:

Mar. 19, 2018
Applicant:

Landmark Graphics Corporation, Houston, TX (US);

Inventors:

Daniel Stanton, Surrey, GB;

Benjamin Stephen Saunders, Oxfordshire, GB;

Graeme Richard Nicoll, Oxfordshire, GB;

Graham Baines, Oxfordshire, GB;

Assignee:

Landmark Graphics Corporation, Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 99/00 (2009.01); G01N 33/24 (2006.01);
U.S. Cl.
CPC ...
G01V 99/005 (2013.01); G01N 33/24 (2013.01); G01V 2210/661 (2013.01); G01V 2210/665 (2013.01);
Abstract

Analysis and display of source-to-sink information according to some aspects includes grouping geochronological data associated with a sediment sample into optimized subpopulations within a reference population and target populations, and producing Gaussian functions for the reference population and the target populations using the subpopulations as a priori constraints. The Gaussian functions describe a distribution of zircons. The subpopulations within the reference population and the target populations are compared based on at least one statistical attribute from the Gaussian functions to identify areas of sediment provenance, and the areas of sediment provenance are displayed in various ways, for example, on a paleographic map as of an age of deposition of the sediment sample. A sink-to-sink analysis can also be performed to identify dissimilarities between samples.


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