The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2022

Filed:

Oct. 07, 2020
Applicant:

GE Precision Healthcare Llc, Wauwatosa, WI (US);

Inventors:

Longqing Wang, Beijing, CN;

Weinan Tang, Beijing, CN;

Kun Wang, Beijing, CN;

Hongbin Wang, Beijing, CN;

Yongchuan Lai, Beijing, CN;

Jiabin Yao, Beijing, CN;

Assignee:

GE Precision Healthcare LLC, Wauwatosa, WI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01R 33/24 (2006.01); G01R 33/483 (2006.01); G01R 33/54 (2006.01);
U.S. Cl.
CPC ...
G01R 33/246 (2013.01); G01R 33/243 (2013.01); G01R 33/4835 (2013.01); G01R 33/543 (2013.01);
Abstract

Embodiments of the present invention provide a magnetic resonance imaging method and system and a computer-readable storage medium. The method comprises: performing pre-scanning, wherein a first sequence and a second sequence are separately performed on a plurality of slices; in the first sequence, two echoes are continuously obtained to respectively obtain first image data and second image data having a first phase offset; in the second sequence, two echoes are continuously obtained to respectively obtain third image data and fourth image data having a second phase offset, the first phase offset and the second phase offset having opposite directions but the same angle; obtaining a plurality of radio-frequency field maps respectively corresponding to the plurality of slices based on the first image data and the second image data, and obtaining a plurality of static magnetic field maps respectively corresponding to the plurality of slices based on at least one of the following two groups: a first image and a third image, and a second image and a fourth image; and calculating formal scanning parameters suitable for a corresponding slice based on at least one of the following two components: each radio-frequency field map, and a corresponding static magnetic field map.


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