The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2022

Filed:

Aug. 27, 2019
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Ha-Young Kim, Seoul, KR;

Sung-We Cho, Hwaseong-si, KR;

Dal-Hee Lee, Seoul, KR;

Jae-Ha Lee, Anyang-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3185 (2006.01); H03K 3/3562 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318541 (2013.01); H03K 3/35625 (2013.01);
Abstract

A scan flip-flop includes an input unit and a flip-flop. The input unit is configured to select one signal from among a data input signal and a scan input signal to supply the selected one signal as an internal signal according to an operation mode. The flip-flop is configured to latch the internal signal according to a clock signal. The flip-flop includes a cross coupled structure that includes first and second tri-state inverters which share a first output node and face each other.


Find Patent Forward Citations

Kim, Ha-Young. (2022). Scan flip-flop and scan test circuit including the same (U.S. Patent No. 11287474). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11287474

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…