The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2022

Filed:

Apr. 01, 2020
Applicant:

City University of Hong Kong, Kowloon, HK;

Inventors:

Chen Ding, Kowloon, HK;

Kwai-Man Luk, Kowloon, HK;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/10 (2006.01); G01R 29/08 (2006.01); H01Q 25/00 (2006.01); H01Q 21/24 (2006.01);
U.S. Cl.
CPC ...
G01R 29/10 (2013.01); G01R 29/0878 (2013.01); H01Q 21/24 (2013.01); H01Q 25/001 (2013.01);
Abstract

System and method for determining gain characteristics of a linearly-polarized antenna. The method includes receiving a measured first amplitude of a forward gain between a circularly-polarized antenna probe and a linearly-polarized standard-gain antenna, a measured second amplitude of a forward gain between the circularly-polarized antenna probe and a linearly-polarized antenna under test, a measured third amplitude of a forward gain between a linearly-polarized antenna probe and the linearly-polarized standard-gain antenna, and a measured fourth amplitude of a forward gain between the linearly-polarized antenna probe and the linearly-polarized antenna under test. The method also includes determining a co-polarization gain and a cross-polarization gain of the linearly-polarized antenna under test based on the measured first amplitude, the measured second amplitude, the measured third amplitude, and the measured fourth amplitude. The determination may be performed using one or more processors.


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