The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2022

Filed:

May. 11, 2018
Applicant:

Beihang University, Beijing, CN;

Inventors:

Zheng Zheng, Beijing, CN;

Xin Zhao, Beijing, CN;

Cui Li, Beijing, CN;

Assignee:

BEIHANG UNIVERSITY, Beijjing, CN;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 23/17 (2006.01);
U.S. Cl.
CPC ...
G01R 23/17 (2013.01);
Abstract

This invention disclosed a system and method for characteristics measurement of electromagnetic signals. The measurement system comprises a multi-repetition-rate pulsed light source, a frequency mixer for electrical signal and optical signal, and a data acquisition and processing device. The measurement system accurately determines the characteristic information of the signal to be measured, such as frequency, phase, intensity, and their variations, by measuring the low frequency mixed signal generated by the multi-repetition-rate pulsed light source and the signal to be measured in the frequency mixer. This system has the advantages of simple structure, high measurement accuracy, low cost and large measurable frequency range. The system can be applied to the measurement of various electromagnetic signals, covering the spectral range from microwave, millimeter wave, to terahertz and even light wave.


Find Patent Forward Citations

Zheng, Zheng. (2022). System and method for measuring time-frequency characteristic of high-frequency electromagnetic signal (U.S. Patent No. 11287457). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11287457

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