The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2022

Filed:

Mar. 02, 2021
Applicant:

Zhejiang University, Hangzhou, CN;

Inventors:

Yong He, Hangzhou, CN;

Yinglei Zhao, Hangzhou, CN;

Pengcheng Nie, Hangzhou, CN;

Lei Lin, Hangzhou, CN;

Xuping Feng, Hangzhou, CN;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/35 (2014.01); G01N 21/3586 (2014.01); G01N 15/08 (2006.01); G01N 21/3563 (2014.01);
U.S. Cl.
CPC ...
G01N 21/3586 (2013.01); G01N 15/08 (2013.01); G01N 21/3563 (2013.01);
Abstract

The present disclosure relates to a method and system for the in-situ detection of cadmium chelates in a plant. The method includes: preparing cadmium chloride and phytochelatin (PC) 2 samples with different concentrations; using terahertz time-domain spectroscopy (THz-TDS) to determine a terahertz (THz) reflection image for the cadmium chloride and PC 2 samples; building a cadmium chloride content detection model according to first spectral data; building a PC 2 content detection model according to second spectral data; determining an optimal mixed sample according to the cadmium chloride content detection model and the PC 2 content detection model; building a Cd—PCcontent detection model according to the optimal mixed sample; and using the Cd—PCcontent detection model to determine a cadmium chelate content in a to-be-tested plant. The present disclosure can quickly and in-situ detect the heavy metal accumulation capacity of a plant.


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