The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2022

Filed:

Nov. 26, 2020
Applicant:

Honda Research Institute Europe Gmbh, Offenbach/Main, DE;

Inventors:

Benedict Flade, Offenbach/Main, DE;

Julian Eggert, Offenbach/Main, DE;

Axel Koppert, Graz, AT;

Simon Kohaut, Frankfurt am Main, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 21/30 (2006.01); G01S 19/40 (2010.01); G01C 21/00 (2006.01);
U.S. Cl.
CPC ...
G01C 21/3844 (2020.08); G01C 21/3807 (2020.08);
Abstract

The invention relates to a method for analyzing localization errors, wherein the method includes the steps of obtaining relative positions and absolute positions of an object moving within a mapped environment, which are generated sequentially over time, calculating differences between the relative positions and absolute positions to determine sequential localization errors, and decomposing the localization errors into a systematic error that is dependent on the orientation of the object and into a systematic error that is independent on the orientation of the object by analyzing the intrinsic dynamics of the localization errors.


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