The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2022
Filed:
May. 17, 2019
Applicant:
Bae Systems Information and Electronic Systems Integration Inc., Nashua, NH (US);
Inventors:
Andrew N. Acker, Honolulu, HI (US);
Michael J. DeWeert, Kaneohe, HI (US);
Assignee:
BAE Systems Information and Electronic Systems Integration Inc., Nashua, NH (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/16 (2006.01); G01J 9/02 (2006.01); G01B 9/02 (2022.01); G01B 9/02098 (2022.01);
U.S. Cl.
CPC ...
G01B 11/162 (2013.01); G01B 9/02098 (2013.01); G01J 9/0215 (2013.01);
Abstract
A shearography a system and method for regularizing phase resolved shearograms with an arctan regularization function to produce regularized phase resolved shearogram outputs is provided. The system and method of the present disclosure optimizes the processing of phase resolved shearography allowing interference fringe analysis techniques to be applied to the regularized phase resolved shearogram output results of the processing.