The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2022

Filed:

Jan. 26, 2018
Applicant:

Walter Ag, Tubingen, DE;

Inventors:

Dirk Stiens, Tubingen, DE;

Thorsten Manns, Tubingen, DE;

Assignee:

WALTER AG, Tubingen, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C23C 28/04 (2006.01); B23B 27/14 (2006.01); C23C 16/34 (2006.01); C23C 16/36 (2006.01); C23C 16/40 (2006.01); C23C 30/00 (2006.01);
U.S. Cl.
CPC ...
C23C 28/044 (2013.01); B23B 27/148 (2013.01); C23C 16/34 (2013.01); C23C 16/36 (2013.01); C23C 16/403 (2013.01); B23B 2228/105 (2013.01);
Abstract

A coated cutting tool includes a substrate and a coating. The coating has an inner layer of 4-14 μm thick TiAlN, an intermediate layer of 0.05-1 μm TiCN and at least one outer layer of 1-9 μm α-AlO. The α-AlOlayer exhibits an X-ray diffraction pattern, as measured using CuKα radiation and theta-2theta scan. A texture coefficient TC(hkl) is defined according to Harris formula, wherein the (hkl) reflections used are (0 2 4), (1 1 6), (3 0 0) and (0 0 12), I(hkl)=measured intensity (peak intensity) of the (hkl) reflection, I0(hkl)=standard intensity according to ICDD's PDF-card No. 00-042-1468, n=number of reflections used in the calculation, and 3<TC(0 0 12)<4.


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