The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2022
Filed:
Apr. 20, 2018
Biomerieux, Inc., Durham, NC (US);
Jack R. Hoffmann, Jr., St. Louis, MO (US);
Gregory R. Maes, Fenton, MO (US);
bioMerieux, Inc., Durham, NC (US);
Abstract
Apparatuses and associated methods of manufacturing are described that provide a tip resistant optical testing instrument configured to rest on a surface. The optical testing instrument includes a shell defining a cavity for receiving a sample tube. The shell includes a bottom shell surface, wherein the bottom shell surface defines at least one support element, wherein the at least one support element is configured to engage the surface to support the optical testing instrument in a testing position, and a translational surface configured to engage the surface to support the optical testing instrument in an angled position. In an instance in which the optical testing instrument tilts from the testing position to the angled position, the translational surface is configured to engage the surface contacting the translational surface to prevent the optical testing instrument from tipping further and allow the optical testing instrument to return to the testing position.