The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2022

Filed:

Jan. 31, 2018
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Jie Cui, Santa Clara, CA (US);

Hong He, Sunnyvale, CA (US);

Yang Tang, Pleasanton, CA (US);

Yuan Zhu, Beijing, CN;

Shuang Tian, Santa Clara, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 52/36 (2009.01); H04W 72/04 (2009.01); H04L 5/00 (2006.01); H04W 52/22 (2009.01);
U.S. Cl.
CPC ...
H04W 52/365 (2013.01); H04L 5/001 (2013.01); H04W 52/225 (2013.01); H04W 52/367 (2013.01); H04W 72/0406 (2013.01); H04W 72/044 (2013.01);
Abstract

A UE may estimate the power headroom value when using shortened Transmission Time Intervals (sTTI). In one implementation, the power headroom value may be calculated based on an estimation of the UE transmission power over two or seven OFDM symbols. Alternatively or additionally, the power headroom value may be calculated based on an estimation of the UE transmission power over the period of an sTTI. Alternatively or additionally, the power headroom value may be calculated based on an average of the UE transmission power over multiple sTTI periods in a subframe. Alternatively or additionally, the power headroom value may be calculated based on a maximum or minimum of the UE transmission power measured over multiple sTTI periods in a subframe. Alternatively or additionally, the power headroom value may be calculated based on UE transmission power measured in the first or the last sTTI period in a subframe.


Find Patent Forward Citations

Loading…