The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2022

Filed:

Dec. 17, 2019
Applicant:

Skyworks Solutions, Inc., Irvine, CA (US);

Inventors:

Daniel Weyer, Austin, TX (US);

Raghunandan Kolar Ranganathan, Round Rock, TX (US);

Assignee:

Skyworks Solutions, Inc., Irvine, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03K 5/1534 (2006.01); G04F 10/00 (2006.01); H03L 7/08 (2006.01); H03K 5/00 (2006.01);
U.S. Cl.
CPC ...
H03K 5/1534 (2013.01); G04F 10/005 (2013.01); H03K 2005/00019 (2013.01); H03L 7/08 (2013.01);
Abstract

A method determines a pin-to-pin delay between clock signals having integrally related frequencies. The method includes generating a delay code corresponding to a delay between a first signal edge of a first clock signal received by a first node of an integrated circuit and a second signal edge of a second clock signal received by a second node of the integrated circuit. The delay code is based on a first time code corresponding to the first signal edge, a second time code corresponding to the second signal edge, a first skew code, a second skew code, and a period of the first clock signal or the second clock signal. The first clock signal has a first frequency, the second clock signal has a second frequency, and the second frequency is integrally related to the first frequency.


Find Patent Forward Citations

Weyer, Daniel. (2022). Measuring pin-to-pin delays between clock routes (U.S. Patent No. 11283437). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11283437

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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