The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2022

Filed:

Mar. 13, 2020
Applicant:

Samsung Display Co., Ltd., Yongin-Si, KR;

Inventors:

Gunwoo Yang, Seoul, KR;

Yongbin Kim, Hwaseong-Si, KR;

Hyun Young Choi, Seoul, KR;

Assignee:

SAMSUNG DISPLAY CO., LTD., Yongin-si, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09G 3/00 (2006.01); G09G 3/3241 (2016.01); G09G 3/3266 (2016.01);
U.S. Cl.
CPC ...
G09G 3/006 (2013.01); G09G 3/3241 (2013.01); G09G 3/3266 (2013.01);
Abstract

A method of detecting a pixel defect for detecting a defect of a pixel including first to fourth transistors, connected to a data line, and receiving a scan signal and an initialization control signal includes turning on the first through fourth transistors by changing the scan signal and the initialization control signal to have a turn-on voltage level in an inspection period, detecting an inspecting current flowing in a path corresponding to the first through fourth transistors using a current detector that is connected to the data line, determining that a threshold voltage of the second transistor is within a normal range when the inspecting current is within a reference range, and determining that the threshold voltage of the second transistor is out of the normal range when the inspecting current is out of the reference range.


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