The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2022
Filed:
Apr. 11, 2019
Fanuc Corporation, Yamanashi, JP;
Yuusuke Oota, Yamanashi, JP;
Shouta Takizawa, Yamanashi, JP;
FANUC CORPORATION, Yamanashi, JP;
Abstract
It is possible to provide an inspection apparatus having a function of automatically checking a validity of an appearance inspection result without manual operation. An inspection apparatus for performing an appearance inspection using a plurality of images obtained by imaging an inspection target includes a determination unit that estimates an inspection result on each of the plurality of images based on a predetermined relationship model between the image and the inspection result and calculates a comprehensive inspection result based on reliability of each of the inspection results on the plurality of images.