The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2022
Filed:
Apr. 06, 2020
Boe Technology Group Co., Ltd., Beijing, CN;
Qian Jia, Beijing, CN;
Jaegeon You, Beijing, CN;
Xinxing Wang, Beijing, CN;
Yingtao Wang, Beijing, CN;
Xuefei Sun, Beijing, CN;
BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;
Abstract
The present disclosure relates to a moire quantitative evaluation method. The method includes obtaining an image of a first pattern layer; obtaining coordinates of each of the first image units; according to the coordinates of each of the first image units and a thickness and a refractive index of a dielectric layer, determining coordinates of projection image units each of which corresponds to a corresponding one of the first image units along an oblique view light path; determining a pixel value of each of the projection image units according to pixel values of second image units in each of the surrounding regions to obtain an oblique view image; superimposing the image of the first pattern layer and the oblique view image to obtain a first superimposed image; converting the first superimposed image into a moire image; and performing a moire quantitative evaluation according to the moire image.