The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2022

Filed:

Jul. 10, 2019
Applicant:

Keyence Corporation, Osaka, JP;

Inventors:

Taiga Nomi, Osaka, JP;

Yasunobu Umehara, Osaka, JP;

Assignee:

KEYENCE CORPORATION, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06K 9/68 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6223 (2013.01); G06K 9/623 (2013.01); G06K 9/6256 (2013.01); G06K 9/6892 (2013.01);
Abstract

A data analyzing device generates a diagram that shows a relationship between a first feature and an objective variable. The first feature is selected in accordance with an input of a user from among features having higher degrees of importance. The data analyzing device divides analysis target data into a plurality of clusters on the basis of values of the first feature, calculates a representative value of the objective variable of each of the clusters, extracts a second feature having a representative value of the objective variable, which is determined as having a significant difference relative to the representative value of the objective variable of the first feature, from at least one of the clusters. The data analyzing device generates a diagram that shows a relationship between the second feature and the objective variable.


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