The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2022
Filed:
Jul. 14, 2020
Dell Products, Lp, Round Rock, TX (US);
Venkat Ramachandran, Round Rock, TX (US);
Navin Kumar N, Bangalore, IN;
Panguluru Vijaya Sekhar, Bangalore, IN;
Nagakalyan Kambapu, Austin, TX (US);
Nikhil Reddy Kota, Round Rock, TX (US);
Madhusudhana Reddy Chilipi, Leander, TX (US);
Hung Dinh, Austin, TX (US);
Puttaraju ChikkannaBommanna, Bangalore, IN;
Nithiyanandham Tamilselvan, Salem, IN;
Ravi R Shastri, Bangalore, IN;
Nitya Seth, Allen, TX (US);
Prasad Ts Rao, Bangalore, IN;
Zishnu Deb Das, Kolkata, IN;
Dell Products L.P., Round Rock, TX (US);
Abstract
An information handling system includes a repository that stores a pre-production validation suite and a production validation suite. The pre-production validation suite includes first validation factors, and the production validation suite includes second validation factors. A processor may deploy an application in a pre-production environment, and validate the application in the pre-production environment using the pre-production validation suite. If the application passes the pre-production validation suite, then the processor may deploy the application in a production environment. The processor also may validate the application in the production environment using the production validation suite, assign a score associated with each one of the first validation factors and each one of the second validation factors, and generate a report based on the score associated with each one of the first validation factors and each one of the second validation factors.