The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2022
Filed:
Apr. 30, 2019
Visa International Service Association, San Francisco, CA (US);
Pushkar Joglekar, Emeryville, CA (US);
Ajit Gaddam, Foster City, CA (US);
Heng Tang, San Mateo, CA (US);
Visa International Service Association, San Francisco, CA (US);
Abstract
Methods and systems for evaluating metrics (e.g., quality of service metrics) corresponding to a monitored computer, detecting metric anomalies, and issuing alerts, are disclosed. A metrics collecting agent, operating on a monitored computer, collects metrics corresponding to the monitored computer and/or one or more monitored services. These metrics are transmitted to a monitoring server that dynamically determines metric thresholds corresponding to normal metrics and anomalous metrics. Using these metric thresholds, along with a machine learning model, the monitoring server can determine whether one or more metrics are anomalous, automatically issue alerts to security and operations teams, and/or transmit a control instruction to the monitored computer in order to fix the issue causing the anomalous metrics.