The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2022

Filed:

Sep. 28, 2020
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Rengaraja Sudarmani, Seongnam-si, KR;

Prathiksha Gautham, Bengaluru, IN;

Uday Kumar N B, Bengaluru, IN;

Abhinav Sharma, Ann Arbor, MI (US);

Sachin Suresh Upadhya, Bengaluru, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); G06F 11/27 (2006.01); G06F 11/07 (2006.01); G06F 11/263 (2006.01); G06F 11/30 (2006.01); G06F 11/277 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1068 (2013.01); G06F 11/076 (2013.01); G06F 11/0751 (2013.01); G06F 11/0772 (2013.01); G06F 11/263 (2013.01); G06F 11/27 (2013.01); G06F 11/277 (2013.01); G06F 11/3037 (2013.01);
Abstract

The present invention relates to a method of validating a memory device. The method includes validating a second memory device based on one or more first microcode instructions stored in a validated predetermined part of a first memory device to detect the operational status of the second memory device. Further, the method includes receiving one or more second microcode instructions upon validating the second memory device. Finally, validating the first memory device based on the one or more second microcode instructions stored in the second memory device to detect the operational status of the first memory device.


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