The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2022
Filed:
Feb. 22, 2018
Telefonaktiebolaget Lm Ericsson (Publ), Stockholm, SE;
Andreas Johnsson, Uppsala, SE;
Christofer Flinta, Stockholm, SE;
Farnaz Moradi, Stockholm, SE;
Jawwad Ahmed, Kista, SE;
Rafael Pasquini, Uberlandia, BR;
Tim Josefsson, Uppsala, SE;
Rolf Stadler, Stockholm, SE;
Telefonaktiebolaget LM Ericsson (publ), Stockholm, SE;
Abstract
A method for predicting a location of a fault in a system is described. The method includes obtaining a faulty unit pertaining to a Supervised Self-Organizing Map (SSOM), wherein the faulty unit has been derived from a sample of machine-level metrics for the system and the SSOM has been trained with a first layer of machine-level metrics and a second layer of service-level metrics. The method further includes expanding a circle originating at the faulty unit until a number of normal units of the SSOM falls within the circle, computing, for each machine-level metric, a score based on differences between the faulty and normal units, wherein a set of scores comprises the respective score for each machine-level metric, and selecting a sub-set of the set, wherein the sub-set comprises the greatest scores of the set, whereby the fault is predicted as located according to metrics represented by the sub-set.