The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2022

Filed:

Dec. 16, 2018
Applicant:

Olympus Corporation, Hachioji, JP;

Inventors:

Shinichi Hayashi, Tokyo, JP;

Hirofumi Takatsuka, Tokyo, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 21/36 (2006.01); G02B 27/58 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0036 (2013.01); G02B 21/0032 (2013.01); G02B 21/0044 (2013.01); G02B 21/0052 (2013.01); G02B 21/0072 (2013.01); G02B 21/0076 (2013.01); G02B 21/361 (2013.01); G02B 21/365 (2013.01); G02B 27/58 (2013.01);
Abstract

A system includes an imaging optical system that forms an optical image of an observed object; a control apparatus that switches between a superresolution observation mode and a normal observation mode; and a rotatable disk located at a position conjugate to a front focal position of the imaging optical system and having a plurality of apertures. The imaging optical system changes a projection magnification of an intermediate image that is a point image of a portion of the observed object that is formed on the disk. The control apparatus sets, during the superresolution observation mode, the projection magnification in a manner such that the intermediate image becomes at least twice as large as the apertures and sets, during the normal observation mode, the projection magnification in a manner such that the projection magnification becomes lower than the projection magnification in the superresolution observation mode.


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