The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2022
Filed:
Dec. 28, 2018
Texas Instruments Incorporated, Dallas, TX (US);
Jeffrey Matthew Kempf, Dallas, TX (US);
Vikrant R. Bhakta, Dallas, TX (US);
Jeffrey Scott Farris, Flower Mound, TX (US);
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Abstract
A depth imaging system includes an optical image sensor, an optical beam steering system, an object identification system, and a depth measurement system. The object identification system is coupled to the optical image sensor. The object identification system is configured to identify an object in an image captured by the optical image sensor. The depth measurement system is coupled to the optical beam steering device. The depth measurement system is configured to, responsive to identification of the object by the object identification system: direct an optical signal, via the optical beam steering device, to the object, and to determine a distance to the object based on a time-of-flight of the optical signal.