The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2022

Filed:

Feb. 05, 2021
Applicant:

Seoul National University R&db Foundation, Seoul, KR;

Inventors:

Jongho Lee, Seoul, KR;

Dongmyung Shin, Seoul, KR;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/36 (2006.01); G01R 33/54 (2006.01);
U.S. Cl.
CPC ...
G01R 33/3607 (2013.01); G01R 33/543 (2013.01);
Abstract

Disclosed is an MRI control signal providing method including obtaining an initial control variable array including time-series values of a control variable for controlling a spatial profile of an induced magnetic field induced by an MRI scanner, obtaining information about a desired spatial profile of the induced magnetic field in the MRI scanner, calculating a differentiation array obtainable by partially differentiating a predetermined function with respect to the control variable, and calculating a scaled array obtained by scaling the differentiation array with a predetermined scaling factor, and generating an updated control variable array from the initial control variable array by subtracting values of the scaled array from values of the initial control variable array.


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