The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2022

Filed:

Sep. 27, 2018
Applicant:

Starkoff Co., Ltd., Seoul, KR;

Inventors:

Tae Hyo Ahn, Seoul, KR;

Hyun Kwon Ahn, Seoul, KR;

Han Soo Kim, Seoul, KR;

Assignee:

Starkoff Co., Ltd., Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 22/06 (2006.01); H04L 67/12 (2022.01); H04Q 9/00 (2006.01);
U.S. Cl.
CPC ...
G01R 22/063 (2013.01); H04L 67/12 (2013.01); H04Q 9/00 (2013.01); H04Q 2209/60 (2013.01);
Abstract

The present invention relates to a virtualization structure for a power/power amount and power quality analyzing apparatus, and a method for acquiring, transmitting and processing meter data using same, whereby an IoT sensor, provided to each inlet line of each distribution board of a facility, transmits, via at least one gateway installed on a network, power data corresponding to power consumed by electrical devices electrically connected to each of the distribution boards, and the power data acquired from each of the IoT sensors are analyzed, and thus electrical physical quantities, such as power/the power amount consumed in the facility and/or power quality, are remotely analyzed and provided.


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Ahn, Tae. (2022). Virtualization structure for power/power amount metering and power quality analyzing apparatus, and method for acquiring, transmitting and processing meter data using same (U.S. Patent No. 11280817). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11280817

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