The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2022

Filed:

Apr. 10, 2019
Applicant:

Nec Laboratories America, Inc., Princeton, NJ (US);

Inventors:

Masanao Natsumeda, Princeton Junction, NJ (US);

Wei Cheng, Princeton Junction, NJ (US);

Haifeng Chen, West Windsor, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 21/133 (2006.01);
U.S. Cl.
CPC ...
G01R 21/133 (2013.01);
Abstract

Systems and methods for detecting anomalies in a plurality of showcases are provided. A system can obtain a corresponding table between each of the plurality of showcases and at least one corresponding sensor. The system obtains information for showcase clustering. The system can include a processor device that can determine at least one cluster of showcases based on the information for showcase clustering and the corresponding table between each of the plurality of showcases and the at least one corresponding sensor. The system can build at least one model for each of the at least one cluster of showcases and detect at least one anomaly based on data from the at least one cluster of showcases and the at least one model.


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