The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2022

Filed:

Mar. 08, 2019
Applicant:

Nippon Telegraph and Telephone Corporation, Tokyo, JP;

Inventors:

Tadashi Minotani, Musashino, JP;

Eri Matsunaga, Musashino, JP;

Soichi Oka, Musashino, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/02 (2006.01);
U.S. Cl.
CPC ...
G01N 27/028 (2013.01); G01N 2291/018 (2013.01); G01N 2291/101 (2013.01);
Abstract

Provided are a crack detection system and a crack detection method that distinguish between a case where a crack is generated in a structure and other cases not to bring about erroneous detection. In a sensor terminal that detects, from a crack generated in a transducer provided on a structure, a crack in the structure, the transducer having a three-layered structure of conductor-insulator-conductor, the crack detection system including: an impedance measurement unit that measures impedance between the two conductors of the transducer; and a crack detection processing unit that calculates, from a frequency characteristic of the impedance, periodicity data regarding periodicity of a frequency at which impedance becomes a peak, and detects a presence of a crack in the structure in a case of periodicity data different from initially-measured periodicity data being included.


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