The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2022
Filed:
Nov. 09, 2017
Hitachi High-tech Corporation, Tokyo, JP;
Kumiko Kamihara, Mito, JP;
Tomonori Mimura, Kasama, JP;
HITACHI HIGH-TECH CORPORATION, Tokyo, JP;
Abstract
An automatic analyzer that allows appropriate setting of analytical parameters which incorporate batch-to-batch variations in reagents. The analytical parameters consist of fixed parameters and variable parameters. The fixed parameters include a reagent-dispensing quantity, a sample-dispensing quantity, measuring wavelength, and the like, each of which becomes a pivot for measurement of a sample, and parameters to be used are selected from an item code and bottle code assigned to a reagent bottle. The variable parameters include a linearity check value, a prozone check value, reaction limit absorbance, technical limits, first standard solution absorbance, variation allowable absorbance, and the like, each of which is associated with sample-measurement result checks. The automatic analyzer reads bar code information from the reagent bottle and adopts variable parameters of a corresponding version with the item code, the bottle code, and batch information relating to the reagent, as a key.