The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2022
Filed:
Nov. 25, 2019
Applicant:
Sysmex Corporation, Kobe, JP;
Inventors:
Assignee:
SYSMEX CORPORATION, Hyogo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 15/14 (2006.01); G01N 21/49 (2006.01); G01N 15/10 (2006.01); G16B 30/00 (2019.01); C12Q 1/6886 (2018.01);
U.S. Cl.
CPC ...
G01N 15/147 (2013.01); C12Q 1/6886 (2013.01); G01N 15/1431 (2013.01); G01N 21/49 (2013.01); G16B 30/00 (2019.02); G01N 2015/1006 (2013.01); G01N 2015/1402 (2013.01); G01N 2015/1477 (2013.01);
Abstract
Disclosed is a cell analysis method comprising: extracting target cells from a population of cells derived from an epithelial tissue on the basis of N/C ratio representing a relative size of a nucleus to a cytoplasm; classifying the target cells into at least a first group and a second group by difference of amount of DNA; and evaluating a pathology of the epithelial tissue by comparing a ratio of numbers of cells between the first and second groups with a threshold; wherein the threshold varies according to a proportion of the target cells in the population.