The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2022
Filed:
Aug. 21, 2019
Apple Inc., Cupertino, CA (US);
Omid Momtahan, Palo Alto, CA (US);
Mehmet Mutlu, Stanford, CA (US);
Miaolei Yan, Santa Clara, CA (US);
Richard Yeh, Los Altos, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
An apparatus for particulate matter (PM) measurement includes a first light source to generate a first light beam and a second light source disposed at a first distance from the first light source to generate a second light beam in parallel to the first light beam to illuminate a PM. The apparatus further includes a first light detector to measure a first timing corresponding to a first self-mixing signal resulting from a reflection and/or back-scattering of the first light beam from a PM, and a second light detector to measure a second timing corresponding to a second self-mixing signal resulting from a reflection and/or back-scattering of the second light beam from the PM. A processor can determine a first velocity of the PM based on a spatial separation between centers of the first light beam and the second light beam and a temporal separation between the first timing and the second timing.