The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2022
Filed:
Dec. 21, 2018
The Regents of the University of California, Oakland, CA (US);
Brandon Hong, La Jolla, CA (US);
Abdelkrim El Amili, La Jolla, CA (US);
Andrew Grieco, La Jolla, CA (US);
Yeshaiahu Fainman, La Jolla, CA (US);
Ang Li, La Jolla, CA (US);
THE REGENTS OF THE UNIVERSITY OF CALIFORNIA, Oakland, CA (US);
Abstract
Devices, systems and methods for optical spectroscopy using a Fourier transform that improve measurement speed, and relax the sampling rate and dynamic range requirements compared to conventional techniques, are described. One exemplary method for optical Fourier transform spectroscopy includes receiving a broadband signal, spectrally partitioning the broadband signal to generate a plurality of spectral channel interferograms, computing a one-dimensional Fourier transform of a function of each of the plurality of spectral channel interferograms to generate each of a plurality of channel spectrums, and reconstructing a spectrum of the broadband signal based on the plurality of channel spectrums. Embodiments of the disclosed technology include a free-space channel dispersed Fourier transform spectrometer and an integrated silicon-on-insulator Fourier transform spectrometer.