The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2022
Filed:
Aug. 01, 2018
Otm Technologies Ltd., Ra'anana, IL;
OTM TECHNOLOGIES LTD., Ra'anana, IL;
Abstract
Interferometric systems and methods for measuring rotational movement are described. In one implementation, an interferometer for measuring rotational movement includes a housing and a light source within the housing configured to project coherent light toward a non-coded surface of an object. The interferometer further includes at least one optical element configured to modify the projected coherent light in a manner accounting for a rotation of the object. The interferometer also includes at least one sensor within the housing including at least one light detector configured to detect reflections of the modified projected coherent light from the opposing non-coded surface as the object rotates relative to the housing. The interferometer further includes at least one processor configured to receive input from the at least one sensor and determine an amount of rotation of the object around the at least one rotational axis.