The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2022

Filed:

Feb. 16, 2017
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

In-kwon Choi, Seongnam-si, KR;

Min-woo Park, Seongnam-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 19/105 (2014.01); H04N 19/132 (2014.01); H04N 19/117 (2014.01); H04N 19/159 (2014.01); H04N 19/176 (2014.01);
U.S. Cl.
CPC ...
H04N 19/132 (2014.11); H04N 19/105 (2014.11); H04N 19/117 (2014.11); H04N 19/159 (2014.11); H04N 19/176 (2014.11);
Abstract

Provided is an image predicting method including: obtaining a plurality of adjacent samples located adjacent to a current block; determining an adjacent sample as a reference sample to be referred to by a current sample, the adjacent sample being from among the plurality of adjacent samples and being indicated by a direction of an intra mode of the current block; and adjusting a sample value of the reference sample according to a reference distance indicating a distance between the reference sample and the current sample, and determining a prediction value of the current sample based on the adjusted sample value of the reference sample.


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