The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2022

Filed:

Nov. 12, 2020
Applicant:

X Development Llc, Mountain View, CA (US);

Inventors:

Emily Cooper, San Francisco, CA (US);

Fengqiang Li, Chicago, IL (US);

Assignee:

X Development LLC, Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/235 (2006.01); H04N 5/355 (2011.01); H04N 13/243 (2018.01); G01S 1/00 (2006.01); G01B 11/25 (2006.01); H04N 5/238 (2006.01);
U.S. Cl.
CPC ...
H04N 13/243 (2018.05); G01B 11/2513 (2013.01); G01S 1/00 (2013.01); H04N 5/238 (2013.01); H04N 5/2351 (2013.01); H04N 5/2354 (2013.01); H04N 5/35536 (2013.01);
Abstract

An example system includes a patterned light projector operable to direct first and second portions of patterned light toward first and second surfaces, respectively, in an environment. The first and second surfaces may be at first and second distances, respectively, from the structured light projector. A graduated optical filter may be situated along an optical path of the patterned light. The graduated optical filter includes first and second regions to attenuate an intensity of the first and second portions of the patterned light, respectively, by first and second amounts, respectively. The first amount is greater than the second amount. The system additionally includes an image sensor operable to generate image data based on at least the first and second portions of the patterned light and a processor configured to determine first and second values indicative of an estimate of the first and second distances, respectively, based on the image data.


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