The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2022

Filed:

May. 21, 2020
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Kazuya Nobayashi, Tokyo, JP;

Akinari Takagi, Yokosuka, JP;

Takashi Sasaki, Yokohama, JP;

Asahi Suzuki, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01); G01C 3/08 (2006.01);
U.S. Cl.
CPC ...
H04N 5/232939 (2018.08); G01C 3/085 (2013.01); H04N 5/23222 (2013.01);
Abstract

A measurement apparatus operable to perform measurement concerning a predetermined item for a target subject which is a measurement target. The apparatus comprises an acquisition unit configured to, for a captured image acquired by capturing of an image capturing range that includes the target subject, acquire distance information indicating a distribution of a subject distance from an image capturing apparatus that performed the capturing and, at least, normal line information that indicates a normal line of a surface of the target subject; and a presentation unit configured to present a notification that indicates an image capturing direction of the image capturing apparatus for performing measurement of the predetermined item based on the normal line information acquired by the acquisition unit.


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