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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11277323 B1

PDFFull Text
Date of Patent:
Mar. 15, 2022

Filed:

Jan. 13, 2016

Systems and methods for distributed measurement collection and analysis

Applicant:

Jpmorgan Chase Bank, N.a., New York, NY (US);

Inventors:

Steve Hagerman, Sunbury, OH (US);

Brian R. Pennell, Galena, OH (US);

Dan J. Gaier, Powell, OH (US);

Assignee:

JPMORGAN CHASE BANK, N.A., New York, NY (US);

Attorney:

Greenberg Traurig LLP

Primary Examiner:

Philip J Chea

Assistant Examiner:

Mohammed Ahmed

Int. Cl.
CPC ...
H04L 12/26 (2006.01); H04L 29/08 (2006.01); H04L 43/08 (2022.01); H04L 43/04 (2022.01); H04L 43/065 (2022.01); H04L 67/06 (2022.01);
U.S. Cl.
CPC ...
H04L 43/08 (2013.01); H04L 43/04 (2013.01); H04L 43/065 (2013.01); H04L 67/06 (2013.01);
Abstract

Systems and methods for distributed measurement collection and analysis are disclosed. In one embodiment, a method for distributed measurement collection and analysis may include (1) receiving, at a local server within a wide area computer network, a file from an electronic device within the wide area computer network, the file comprising a plurality of metrics for the electronic device over a period comprising a plurality of first intervals, wherein the file is received at a second interval; (2) the local server the local server analyzing the file for at least one maintenance issue for the electronic device; and (3) the local server providing the file to the central server at a third interval, the central server outside the wide area network.

Find Patent Forward Citations

Hagerman, Steve. (2022). Systems and methods for distributed measurement collection and analysis (U.S. Patent No. 11277323). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11277323

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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