The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2022

Filed:

Feb. 28, 2019
Applicant:

Nippon Carbon Co., Ltd., Tokyo, JP;

Inventors:

Takanobu Kawai, Shiga, JP;

Ken-ichi Hongawa, Shiga, JP;

Hayato Matsumoto, Shiga, JP;

Kazuaki Yamashita, Shiga, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01M 4/58 (2010.01); H01M 4/13 (2010.01); H01M 4/587 (2010.01); H01M 4/583 (2010.01); H01M 4/133 (2010.01); H01M 10/0525 (2010.01); H01M 4/36 (2006.01); H01M 4/02 (2006.01);
U.S. Cl.
CPC ...
H01M 4/587 (2013.01); H01M 4/133 (2013.01); H01M 4/366 (2013.01); H01M 4/583 (2013.01); H01M 10/0525 (2013.01); H01M 2004/021 (2013.01); H01M 2004/027 (2013.01); Y02E 60/10 (2013.01); Y02P 70/50 (2015.11); Y02T 10/70 (2013.01); Y10T 29/49115 (2015.01);
Abstract

A negative electrode active material for a lithium ion secondary battery, made up of substantially spherical graphite particles (A), having fine protrusions on the surfaces thereof and obtained by impregnating and coating substantially spherical graphite particles with a mixture of pitch and carbon black, followed by baking in a range of 900 to 1500° C. In accordance with Raman spectroscopic analysis of the particles (A) using argon laser Raman scattering light, there exists a G-band composite peak comprising peaks in the vicinity of 1600 cm, and 1580 cm, respectively, and at least one peak in the vicinity of D-band at 1380 cm, an interlayer distance of the lattice plane d, obtained by wide-range X-ray diffraction, being in the range of 0.335 to 0.337 nm.


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