The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2022

Filed:

Oct. 23, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Xue Mei Deng, Beijing, CN;

Ang Yi, Beijing, CN;

Jun Hong Zhao, ShanghDi, CN;

Lu Huang, Beijing, CN;

Ya Juan Tong, Beijing, CN;

Hui Huang, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 20/64 (2022.01); G06V 10/94 (2022.01); G06V 10/10 (2022.01);
U.S. Cl.
CPC ...
G06V 20/653 (2022.01); G06V 10/955 (2022.01); G06V 10/16 (2022.01); G06V 10/17 (2022.01); G06V 2201/12 (2022.01);
Abstract

In an approach, data of a plurality of points is sampled in a target area, wherein the data of each point of the plurality of points comprises position information and a height value. A first area of a target area is determined, wherein the height value of each point of the plurality of points in the first area complies with a first range. A second area of the target area is determined, wherein the height value of each point of the plurality of points in the second area complies with a second range. A third area of the target area is determined, wherein the height value of each point of the plurality of points in the third area complies with a third range. A first pattern is generated, wherein the first pattern is a combination of the first area and the third area.


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