The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2022

Filed:

Dec. 13, 2018
Applicant:

Advanced Micro Devices, Inc., Santa Clara, CA (US);

Inventors:

Skyler Jonathon Saleh, La Jolla, CA (US);

Jian Mao, San Diego, CA (US);

Assignee:

Advanced Micro Devices, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/30 (2018.01); G06T 15/00 (2011.01); G06T 15/06 (2011.01);
U.S. Cl.
CPC ...
G06T 15/06 (2013.01); G06F 9/30087 (2013.01); G06T 15/005 (2013.01);
Abstract

Described herein is a merged data path unit that has elements that are configurable to switch between different instruction types. The merged data path unit is a pipelined unit that has multiple stages. Between different stages lie multiplexor layers that are configurable to route data from functional blocks of a prior stage to a subsequent stage. The manner in which the multiplexor layers are configured for a particular stage is based on the instruction type executed at that stage. In some implementations, the functional blocks in different stages are also configurable by the control unit to change the operations performed. Further, in some implementations, the control unit has sideband storage that stores data that 'skips stages.' An example of a merged data path used for performing a ray-triangle intersection test and a ray-box intersection test is also described herein.


Find Patent Forward Citations

Loading…