The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2022
Filed:
Feb. 11, 2020
Carl Zeiss Industrielle Messtechnik Gmbh, Oberkochen, DE;
Christian Hoerr, Flintsbach, DE;
Carl Zeiss Industrielle Messtechnik GmbH, Oberkochen, DE;
Abstract
An apparatus for determining at least one of dimensional and geometric properties of a measurement object has a first measurement arrangement, which records first measurement values. The first measurement values represent respective positions of first selected measurement points relative to a first coordinate system. The apparatus has a second measurement arrangement, which records second measurement values. The second measurement values represent respective surface normals at second selected measurement points. The first and second measurement arrangements are arranged spatially fixedly with respect to one another on a housing body. The apparatus further has a third measurement arrangement, which records third measurement values. The third measurement values represent a respective current position of the housing body relative to a further coordinate system. The evaluation unit is configured to combine the first measurement values and the second measurement values positionally correctly using the third measurement values.