The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2022

Filed:

Jun. 30, 2020
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Dikla Dotan-Cohen, Herzliya, IL;

Ido Cohn, Tel Aviv, IL;

Sagi Hilleli, Rishon Lezion, IL;

Jonathan Rabin, Herzliya, IL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 30/02 (2012.01); H04W 4/029 (2018.01); H04L 67/306 (2022.01); H04L 67/50 (2022.01); H04W 4/021 (2018.01);
U.S. Cl.
CPC ...
G06Q 30/0255 (2013.01); G06Q 30/0201 (2013.01); G06Q 30/0252 (2013.01); G06Q 30/0261 (2013.01); H04L 67/22 (2013.01); H04L 67/306 (2013.01); H04W 4/021 (2013.01); H04W 4/029 (2018.02);
Abstract

Pieces of location history data corresponding to an identified place of interest are obtained. Each piece of the obtained location history data references one or more signals detected at the identified place of interest and also references temporal data that corresponds to the detected signal(s). Some of the obtained pieces of location history data that represent one or more short, pass-through visits at the identified place of interest are identified. Based on the identified pieces that represent the short visit(s), conditions for determining the intent of future detected location visits at the identified place of interest are generated. The generated conditions can then be employed to determine that a detected location visit of a particular computing device determined to be at the identified place of interest is an extended visit as opposed to a short visit.


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