The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2022
Filed:
Feb. 25, 2019
Applicant:
Sysmex Corporation, Kobe, JP;
Inventors:
Kohei Yamada, Kobe, JP;
Kazumi Hakamada, Kobe, JP;
Yuki Aihara, Kobe, JP;
Kanako Masumoto, Kobe, JP;
Yosuke Sekiguchi, Kobe, JP;
Krupali Jain, Kobe, JP;
Assignee:
SYSMEX CORPORATION, Kobe, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2006.01); G06N 20/00 (2019.01); G06T 7/00 (2017.01); G06K 9/46 (2006.01); G06K 9/00 (2022.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06K 9/00147 (2013.01); G06K 9/4604 (2013.01); G06K 9/4652 (2013.01); G06N 20/00 (2019.01); G06T 7/0012 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30024 (2013.01);
Abstract
An image analysis method for analyzing an image of a tissue collected from a subject using a deep learning algorithm of a neural network structure. The image analysis method includes generating analysis data from the analysis target image that includes the tissue to be analyzed, inputting the analysis data to a deep learning algorithm, and generating data indicating a layer structure configuring a tissue in the analysis target image by the deep learning algorithm.