The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2022
Filed:
Aug. 31, 2018
Salesforce.com, Inc., San Francisco, CA (US);
salesforce.com, inc., San Francisco, CA (US);
Abstract
Methods, systems, and devices supporting differential support for frequent pattern (FP) analysis are described. Some database systems may analyze data sets to determine FPs of data attributes within the data sets. However, if data distributions for different types of data attributes vary greatly, more frequent data attribute types may skew the FPs away from the less frequent types. To reduce the noise of common attributes while maintaining sensitivity to the less common attributes, the database system may implement multiple minimum support (e.g., frequency) thresholds. For example, the database system may adaptively categorize the different data attribute types into data categories based on their distributions and may dynamically determine support thresholds for the categories. Using different minimum support thresholds for different data categories allows the system to filter out data attribute patterns based on the distributions of the data attribute types in the pattern.