The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2022
Filed:
Jun. 14, 2019
Oracle International Corporation, Redwood Shores, CA (US);
Eric Hsiao, San Mateo, CA (US);
James Dang, Union City, CA (US);
Jeffrey Toillion, Half Moon Bay, CA (US);
Rahul V. Herwadkar, Foster City, CA (US);
Leon Zeng, Shenzhen, CN;
Xiaochao Zhou, Foster City, CA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
A data analysis system is provided that enables users to perform complex data analyses based upon data that may be spread across multiple data sources. The data analysis system is configured to generate a combined query that is capable of extracting data from the multiple data sources. The user may provide analysis information describing the analysis the user desires to perform on the extracted data. In response, the data analysis system is further configured to automatically augment the combined query with program or code to implement the user-specified analysis. Execution of the augmented or modified combined query generates an analysis result set resulting from performing the user-specified analysis. The data analysis system provides a flexible and easy-to-use platform for a user, even a non-technical user, to perform complex data analyses using data stored in multiple different data sources.