The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2022

Filed:

Jan. 29, 2019
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Farzad Khosrowpour, Pflugerville, TX (US);

Amihai Savir, Sansana, IL;

Anat Parush Tzur, Beer Sheva, IL;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06F 11/36 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 11/3608 (2013.01); G06F 11/3612 (2013.01); G06N 20/00 (2019.01);
Abstract

Techniques are disclosed for determining the run-time performance of an application executing on a computing system with low impact on the performance of the computing system. For example, a time series telemetry data stream is obtained for each of a plurality of key performance indicators during run-time execution of the application on a computing system having a given system configuration. One or more statistical features are extracted from each time series telemetry data stream. Model parameters of a machine learning performance score model are populated with values of the extracted statistical features. A run-time performance score of the application is then determined using the model parameters of the machine learning performance score model populated with the values of the extracted statistical features.


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