The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2022

Filed:

Jun. 06, 2019
Applicant:

Robert Bosch Gmbh, Stuttgart, DE;

Inventors:

Rumi Ghosh, Palo Alto, CA (US);

Soundararajan Srinivasan, Cambridge, MA (US);

Ruobing Chen, Mountain View, CA (US);

Shan Kang, Mountain View, CA (US);

Marc Naumann, Sunnyvale, CA (US);

Mahesh Goud Tandarpally, Los Angeles, CA (US);

Assignee:

Robert Bosch GmbH, Stuttgart, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/418 (2006.01); G06N 20/10 (2019.01); G06F 17/18 (2006.01); G06K 9/62 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G05B 19/41885 (2013.01); G06F 11/3428 (2013.01); G06F 17/18 (2013.01); G06K 9/6256 (2013.01); G06K 9/6267 (2013.01); G06N 20/10 (2019.01);
Abstract

Methods and systems of identifying a time reduction in a manufacturing time associated with a plurality of products. One system includes an electronic processor configured to receive training data. The electronic processor is also configured to determine a first set of testing parameters from the plurality of testing parameters to remove for the assembly line based on the training data and determine a second set of testing parameters to keep by removing the first set of testing parameters from the plurality of testing parameters. The electronic processor is also configured to determine a predictive model to replace the first set of testing parameters based on the training data associated with the second set of testing parameters, and automatically update a testing process for the assembly line to turn off the first set of testing parameters and use the predictive model in place of the first set of testing parameters.


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