The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2022
Filed:
Nov. 06, 2018
Infineon Technologies Ag, Neubiberg, DE;
Markus Dielacher, Graz, AT;
Martin Flatscher, Graz, AT;
Stefan Gansinger, Graz, AT;
Robert Lobnik, Bad Eisenkappel, AT;
Infineon Technologies AG, Neubiberg, DE;
Abstract
An example time-of-flight device may include an emitter component configured to emit a plurality of modulated signals toward an object during a transmission window, wherein the plurality of modulated signals emitted during the transmission window are to be used to determine a single distance measurement associated with the object and the time-of-flight device. The time-of-flight device may include a control component configured to cause, via the emitter component, emission of a first modulated signal and emission of a second modulated signal, of the plurality of modulated signals, toward the object, wherein the first modulated signal is emitted during a first portion of the transmission window and has a first phase of a plurality of preconfigured phases, and wherein the second modulated signal is emitted during a second portion of the transmission window and has a second phase of the plurality of preconfigured phases; and cause, using the emission of the first modulated signal and the emission of the second modulated signal during the transmission window, an emulation of a transmission of a measurement signal that has a measurement phase defined based on the first phase and the second phase, wherein the measurement phase is different from the first phase and the second phase.