The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2022
Filed:
Sep. 05, 2018
Topcon Corporation, Tokyo, JP;
Ikuo Ishinabe, Tokyo, JP;
Taichi Yuasa, Tokyo, JP;
TOPCON CORPORATION, Tokyo, JP;
Abstract
A method of correcting a measurement value of a laser scanner includes: in a laser scanner including a light emitting unit, a light receiving unit, a distance measuring unit, an optical axis deflecting unit having at least a pair of prisms deflecting a distance measuring light and a reflected distance measuring light, and an emitting direction detecting unit detecting a deflection angle and an emitting direction of the distance measuring light from the optical axis deflecting unit, (a) measuring a distance to a measurement point, (b) detecting rotation angles of the prisms, and (c) obtaining, based on rotation angles of the prisms, a true distance measurement value corrected for a length of an optical path length difference in light emission and/or light reception caused according to the rotation angles of the prisms by subtracting the optical path length difference from a distance measurement value of the distance measuring unit.