The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2022

Filed:

Mar. 30, 2018
Applicant:

National University Corporation Okayama University, Okayama, JP;

Inventor:

Keiji Tsukada, Okayama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/035 (2006.01); G01R 33/00 (2006.01); G01R 33/06 (2006.01); G01R 33/07 (2006.01); G01R 33/09 (2006.01);
U.S. Cl.
CPC ...
G01R 33/035 (2013.01); G01R 33/0082 (2013.01); G01R 33/063 (2013.01); G01R 33/07 (2013.01); G01R 33/09 (2013.01);
Abstract

Provided is a magnetic field measuring device which has good temperature stability and which enables an improvement by making it possible for the sensitivity of a Hall element, a magnetic impedance (MI) element or a magnetic resistance (MR) element, which are conventionally used extensively, to be set freely. This magnetic field measuring device comprises: a temperature maintaining means for maintaining an extremely low temperature state in which a superconductor adopts a superconducting state; a magnetic sensor which is provided inside the temperature maintaining means to detect a magnetic field; and a magnetic field space forming means for forming a magnetic field space specific to the superconducting state, by adopting a superconducting state inside the temperature maintaining means; wherein the magnetic sensor is disposed in the magnetic field space.


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