The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2022

Filed:

Dec. 24, 2019
Applicant:

Fuji Electric Co., Ltd., Kanagawa, JP;

Inventors:

Kazuyoshi Umezawa, Hyogo, JP;

Satoshi Ishida, Hyogo, JP;

Motohiro Tsukuta, Hyogo, JP;

Yasuyuki Noto, Hyogo, JP;

Assignee:

FUJI ELECTRIC CO., LTD., Kanagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/42 (2006.01);
U.S. Cl.
CPC ...
G01R 31/42 (2013.01);
Abstract

An abnormality cause identifying method that is applied to a computer is provided. The abnormality cause identifying method includes: outputting a control parameter that is calculated based on a detection value detected from a power converter that converts power supplied from a power supply and supplies the converted power to a load; plotting, on coordinates having at least two axes, a value that is calculated using the detection value and the control parameter; and identifying an abnormality cause based on a quadrant of the coordinates on which the value is plotted.


Find Patent Forward Citations

Umezawa, Kazuyoshi. (2022). Abnormality cause identifying method, abnormality cause identifying device, power converter and power conversion system (U.S. Patent No. 11275124). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11275124

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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